X-Ray Fluorescence

The high-caliber all-rounder

The FISCHERSCOPE® X-RAY XDV®-SDD is one of the most powerful X-ray fluorescence instruments in the Fischer portfolio. This XRF spectrometer is equipped with a high-resolution and powerful silicon drift detector (SDD) with an effective area of 50 mm². This allows you to measure even the thinnest layers precisely and non-destructively – e. g. gold coatings about 2 nm thick on lead frames. 

In combination with the new in-house developed digital pulse processor DPP+, you can boost your measurements performance to a new level. Even higher count rates can now be processed, resulting in shorter measuring times or improved repeatability of your measurement results.

At the same time, the XDV-SDD is perfectly suited for non-destructive material analysis. For example, its detection sensitivity for traces of lead in plastic is about 2 ppm – several orders of magnitude lower than the values required by RoHS or CPSIA. To create ideal conditions for each XRF coating thickness measurement, the XDV-SDD has changeable collimators and primary filters, which allows working on a scientific level. The extremely robust device with its intuitive control panel is easy to operate via a joystick and buttons, and is designed specifically for series tests in industrial use.

Features

• Premium universal XRF analyzer for automated measurements of very thin coatings (< 0.05 μm) and for fine material analysis in the sub per mil range according to ISO 3497 and ASTM B 568
• Microfocus tube with tungsten anode
• 4x changeable aperture for optimized measuring conditions
• 6x changeable filter for optimum excitation conditions for more complex tasks
• Extremely powerful silicon drift detector (SDD) with extra-large effective area of 50 mm²
• Digital pulse processor DPP+ for higher count rates, reduced measuring times or better repeatability of your measurement results
• Analysis of elements from Al(13) to U(92)
• Sample heights up to 14 cm
• High precision, programmable XY stage with positioning accuracy of < 5 µm for automated measurements on small structures 
• DCM method for simple and fast adjustment of the measuring distance
• Fully protected instrument with type approval according to current radiation protection legislation

Applications

• Measurement of functional coatings in the electronics and semiconductor industry, e. g. coating thickness measurement of gold coatings down to 2 nm
• Analysis of thin and very thin coatings in the electronics and semiconductor industry, e. g. gold/palladium coatings of ≤ 0.1 µm
• Determination of complex multilayer systems
• Measurement of hard material coatings
• Coating thickness measurement in the photovoltaics industry
• Trace analysis of hazardous substances such as lead and cadmium according to RoHS, WEEE, CPSIA and other directives for electronics, packaging and consumer goods
• Analysis and authenticity testing of gold and other precious metals, as well as alloys thereof
• Direct determination of the phosphorus content in functional NiP coatings

Optimized for the electronics industry: Measuring ENIG and ENEPIG on a new level

The new FISCHERSCOPE® X-RAY XDV®-μ with digital pulse processor DPP+ with its significant performance boost is the optimal solution for measuring electroless nickel/chemical gold (ENIG) or electroless nickel/che­mical palladium/chemical gold (ENEPIG) coatings.

The FISCHERSCOPE® XDV®-μ spectrometers are Fischer’s high-end X-ray fluorescence (XRF) series, developed for precise layer thickness measurement and material analysis on the tiniest of structures. All units are equipped with a polycapillary optics that focuses the X-ray beam to 10 μm FWHM. The combination of polycapillary and digital pulse processor DPP+ delivers outstanding measurement results and ensures high count rates and even better standard deviations or shorter measurement times. In addition, various filters as well as voltage and current settings allow the best excitation conditions for complex applications with up to 24 elements.

All Fischer XRF instruments are supplied with the proven WinFTM software, the most versatile software on the market. Suitable for many industries and applications, it offers extensive functionalities, for example automatic pattern recognition, guided calibration process or fully customizable reports.

Features

• Powerful premium model for precise coating thickness measurement and material analysis on smallest structures and thinnest coatings < 0.1 µm
• Microfocus tube with tungsten anode; molybdenum anode optional
• 4-fold changeable filter
• Extremely powerful silicon drift detector with 20 mm² or 50 mm² area for highest precision on thin films
• In-house manufactured polycapillary optics for smallest measuring points down to 10 μm FWHM, at short measuring times with high intensity
• Digital pulse processor DPP+ for higher count rates, reduced measuring times or better repeatability of your measurement results
• Analysis of elements from Al(13) to U(92), helium purge available, simultaneous measurement of up to 24 elements
• High precision, programmable XY stage with positioning accuracy of < 5 µm for most accurate sample positioning and automatic pattern recognition, for best repeatability precision

Applications

• Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames
• Measurement of functional coatings in the electronics and semiconductor industry
• Determination of complex multi-coating systems
• Automated measurements, e. g. in quality control
• Measurement of light elements, e. g. determination of the phosphorus content (in ENIG/ENEPIG) under gold and palladium

Optimized for Fast, Cost-effective XRF Measurements

The FISCHERSCOPE® X-RAY XDAL® 600 is designed as a user-friendly XRF bench-top instrument for non-destructive coating thickness measurements and material analysis. It is characterized by a compact, practical design which allows simple handling and operation. For quick and easy sample positioning, The XDAL 600 is equipped with a manually adjustable sample table (scissors table). Additionally, XRF analysis of layers with complex compositions or low concentrations is easily achieved. Even the coating thickness measurement and XRF material analysis of samples with complex geometries is straightforward.

As you are used to from all Fischer XRF spectrometers, the XDAL 600 is universally applicable. It features electrically interchangeable 4-fold aperture as well as 3-fold primary filter to create ideal excitation conditions for every measurement, resulting in maximum flexibility for a wide range of measurement tasks. The digital pulse processor DPP+ enables the processing of high count rates for highest measuring precision and shorter measuring times.

This energy dispersive XRF measuring instrument is developed with special attention to robustness and durability. So, all requirements are set for a long service life under all conditions, such as in electroplating and production environments. Like all Fischer XRF analyzers, you benefit from outstanding accuracy and long-term stability. Thus, the necessity of recalibration is considerably reduced and you save time and effort.

Features

• XRF measuring instrument fulfils X-ray standards DIN ISO 3497 and ASTM B 568
• Non-destructive material analysis and coating thickness measurement of very thin coatings
• Fischer digital pulse processor DPP+ and sensitive Silicon drift detector (SDD) for maximum precision, high resolution and short measuring times
• 4x changeable aperture (collimator): Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 1 mm (39.4 mils), Ø 3 mm (118 mils)
• 3x changeable primary filter
• Manually adjustable sample table (scissors table) for quick and easy sample positioning
• Laser pointer as positioning aid supports the quick alignment of the sample
• High-resolution color video camera simplifies the precise determination of the measurement area
• Operation, evaluation of measurements and clear presentation of measured values via user-friendly Fischer WinFTM® software

Applications

• Functional coatings on lead frames, connectors or printed circuit boards in the electronics and semiconductor industries
• Determination of complex multi-lyer coating systems
• Determination of the lead content in solder
• Determination of the phosphorous content in NiP coatings

Is it really gold? Authenticity testing of jewelry and precious metals

Not all that glitters is gold – much less pure gold! If you want to know exactly how much gold it contains, you can rely on our X-ray fluorescence (XRF) measuring instruments: With the GOLDSCOPE SD® you can quickly check the authenticity of jewelry and analyze the composition of gold and precious metals – non-destructively.

The features of the different GOLDSCOPE SD models assist you optimally with your daily work at the jewelry store, the pawnshop or in the testing laboratory. The procedure is clean and requires no chemicals. And like all Fischer X-ray fluorescence XRF spectrometers, the GOLDSCOPE SD measures with the excellent precision you’ve come to expect.

The handling of the XRF devices is tailored to the needs of the precious metals and jewelry industry. The most important measuring tasks for analyzing gold and precious metals are already pre-programmed in the operating software, WinFTM. All you have to do is place the sample on the measurement window and press start. This makes the valuation of jewelry and coins foolproof.

Features

• Non-destructive, fast and precise XRF gold test
• Spacious measurement chamber
• Compact and robust design, meant for long – and long-term – use
• No sample preparation needed. Simply place the item on the measuring window in the measurement chamber
• A camera shows you the exact measurement location
• Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
• For pawnshops and gold buyers: GOLDSCOPE SD 510 with silicon PIN detector and especially compact design 
• For pawnshops, gold buyers and small laboratories: GOLDSCOPE SD 515 with silicon PIN detector
• For testing labs, assaying offices and refineries: GOLDSCOPE SD 520 with silicon drift detector (SDD) for the highest resolution at lowest detection thresholds
• For testing labs, assaying offices, and jewelry manufacturers: GOLDSCOPE SD 550 with silicon drift detector (SDD) and exchangeable filters and collimators

Applications

• Composition of precious metal alloys
• Authenticity testing of gold jewelry, watches and coins
• Analysis of dental alloys
• Rhodium plating on gold alloys and gold plating on silver alloys
• Multi-layer systems as substitute for materials with nickel content

Entry-level X-ray fluorescence XRF analysis

The FISCHERSCOPE® X-RAY XUL® series is truly fundamental equipment for every electroplating shop. These straightforward and affordable energy dispersive X-ray fluorescence XRF analyzers are excellent for monitoring the bath composition, but they’re also indispensable helpers when it comes to quality control: robust and perfectly suited for measuring galvanic coatings on mass-produced parts like nuts and bolts.

All the XRF spectrometers in the XUL / XULM series are easy and intuitive to operate. Larger samples can be simply placed in the measuring chamber by hand; or, for smaller items such as plugs, the instruments can be outfitted with a manual sample stage. Although the measuring devices are compact, they offer plenty of room for your test pieces – up to a height of 17 cm.

And if you have several different measuring tasks, the FISCHERSCOPE X-RAY XULM has exchangeable filters and collimators, so you can create the optimum measuring conditions for all your applications. In addition, the XULM has a built-in microfocus tube, which delivers precise results even with small measuring spots and thin layers.

Features

• Analysis of galvanic baths and coating thickness measurement with X-ray fluorescence according to DIN ISO 3497 and ASTM B 568
• Smallest measurement spot with the XULM approx. 0.1 mm; smallest measurement spot with the XUL approx. 0.5 mm
• Tungsten X-ray tube or tungsten microfocus tube (XULM) as an x-ray source
• Proven proportional counter tube detectors for short measuring times
• Collimator: fixed or 4x automatically changeable
• Primary filter: fixed or 3x automatically changeable
• Fixed sample support or manual XY stage
• Video camera for optical observation of the measuring spot
• Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
• Certified fully protective device 

Applications

• Galvanic coatings such as zinc on iron or zinc-nickel on iron as corrosion protection for mass-produced parts (nuts and bolts)
• Analysis of the metal content of electroplating baths
• Decorative coatings Cr/Ni/Cu/ABS
• Coatings on connectors and contacts in the electronics industry

An XRF Instrument for Every Application

Like the XUL series, the XRF instrument spectrometer FISCHERSCOPE® X-RAY XAN® are ideally suited for analyzing simply shaped samples. However, a great advantage of the XAN series lies in their high-quality semiconductor detectors. And X-ray fluorescence (XRF) allows you not only to measure the thickness of coatings but also to analyze the composition of alloys (e. g. copper).

In total, the XAN series comprises 5 bench-top XRF spectrometers that cover a wide range of applications. The XAN 215 has a cost-effective PIN detector. This XRF Instrument It’s is ideal for simple coating thickness tasks, e.g. zinc on iron or Au/Ni/Cu. For more complex applications with alloys or precious metals, we recommend our XRF instruments devices with a silicon drift detector (e.g. the XAN 220): Due to its much higher resolution, it can reliably distinguish between gold and platinum. And when you need to detect traces of heavy metals and other hazardous substances, the XAN 250 is your solution.

Even More Powerful Thanks to DPP+ and Larger SDD

With the XAN 220, XAN 222, XAN 250 and XAN 252, you can now measure even more precisely and quickly. Like the GOLDSCOPE SD 520 and SD 550, the instruments are equipped with the latest digital pulse processor DPP+ – completely developed in-house by Fischer. By using the new processor in conjunction with the also newly available, larger silicon drift detector (50 mm² effective area), even more signals of the sample can be processed. This results in an excellent energy resolution. Your benefit: Shorten the measuring time up to 3 times or reduce the absolute standard deviation of the repeatability by up to 45 %.

Features

• Universal X-ray fluorescence (XRF) spectrometers for metal and precious-metal analysis, coating thickness measurement and RoHS screening according to DIN ISO 3497 and ASTM B 568
• Premium semiconductor detectors (PIN and SDD) ensure excellent detection accuracy and high resolution
• XAN 250 and 252: for measuring light elements like aluminum, silicon or sulfur 
• Collimator: fixed or 4x changeable, smallest measuring spot approx. 0.3mm
• Primary filter: fixed or 6x changeable
• Fixed sample support or a manual XY stage
• Video camera for easy location of the best measurement site
• Up to 17 cm sample height 
• Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance

Applications

• Non-destructive analysis of dental alloys, silver test
• Multilayer coatings
• Analysis of functional coatings at least 10 nm thick in the electronics and semiconductor industry
• Trace analysis in consumer protection, e.g. testing for the presence of lead in toys
• Metal-alloy determinations according to the highest accuracy requirements in the jewelry industry and in refineries

The specialist for field duty and much more

The FISCHERSCOPE® X-RAY XAN® 500 is the most versatile X-ray fluorescence (XRF) system available. As a handheld XRF analyzer, it’s perfect for inspecting coatings on bulky items like airplane parts, pipes or turbine blades in a running production line. 

In contrast to other portable XRF devices on the market, the FISCHERSCOPE XAN 500 determines coating thickness very precisely. Its 3-point support makes it easy to place correctly and keeps it stable during the entire measurement. A high-quality silicon drift detector (SDD) ensures the precision needed to analyze alloy layers such as zinc-nickel. 

But the XAN 500 is more than just a XRF measuring system for bulky parts. With the optionally available measuring box, it can be transformed into a bench-top instrument in just a few simple steps. This lets you quickly and easily check small parts such as nuts and bolts.

Features

• Universal handheld XRF analyzer for precise coating thickness measurement and material analysis – even with difficult material combinations; complies with DIN ISO 3497 and ASTM B 568
• Weight 1.9 kg
• One battery charge lasts for up to 6 hours of operation
• Measurement spot: 3 mm Ø
• High-resolution silicon drift detector
• Rated IP54 for outdoor use
• Optional measuring box for use as a XRF bench-top device 
• Data evaluation with the full version of WinFTM® software

Applications

• Testing on bulky objects and, with the measuring box, also small parts
• Simultaneous determination of both the thickness and the composition of a layer in a single measurement (e.g. ZnNi on Fe)
• Standard-free measurement of unknown alloys 
• Measurements on large, coated parts such as machine components and housings 
• Testing of galvanic layers
• Analysis of the metal content of electroplating baths

The high-end all-rounder

XRF Film Thickness Measurement The XDV®-SDD is one of the most powerful X-ray fluorescence analyzers in the Fischer portfolio for Film Thickness Measurement. This XRF spectrometer is equipped with a particularly sensitive silicon drift detector (SDD). This allows you to measure even the thinnest layers non-destructively – e.g. gold coatings about 2 nm thick on lead frames. 

At the same time, the XDV-SDD is perfectly suited for non-destructive material analysis. For example, its detection sensitivity for traces of lead in plastic is about 2 ppm – several orders of magnitude lower than the values required by RoHS or CPSIA.

So that you can create the ideal conditions for each XRF film thickness measurement, the XDV-SDD has exchangeable collimators and primary filters, which allows work on a scientific level. The extremely robust device is nonetheless easy to operate and is designed specifically for series tests in industrial use. Features like its automatically extending measuring stage and the live image of the measuring site make your day-to-day work easier.

Features

• Premium universal XRF analyzer for automated measurements of very thin coatings (< 0.05 μm) and for fine material analysis in the sub per mil range according to ISO 3497 and ASTM B 568
• Extremely powerful silicon drift detector from Fischer with extra-large effective area (SDD 50 mm²)
• 6x changeable primary filter and 4x changeable collimators to optimize the measuring conditions
• Analysis of light elements like aluminum, silicon and phosphorus
• Sample heights up to 14 cm
• High precision, programmable XY stage with positioning accuracy of < 5 µm for automated measurements on small structures 
• Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
• Extremely robust construction for serial testing, with outstanding long-term stability
• Certified fully protective device

Applications

• Testing very thin coatings in the electronics and semiconductor industries, e .g. gold and palladium layers less than 50 nm thick
• ENIG/ENEPIG
• Measurement of hard material coatings in automotive manufacture
• Coating thickness measurement in the photovoltaics industry
• Trace analysis of hazardous substances such as lead and cadmium according to RoHS, WEEE, CPSIA and other directives for electronics, packaging and consumer goods
• Analysis and authenticity testing of gold and other precious metals, as well as alloys thereof
• Direct determination of the phosphorus content in functional NiP coatings