SEM Specimen Preparation

PECS II System

Broad argon ion beam system designed to polish and coat samples for SEM imaging and analytical techniques.

Advantages: 

Fully automated argon ion polishing system suitable for preparation of SEM samples to prepare damage free surfaces, cross sections and deposit coatings to protect or eliminate charging.

  • Polish, etch or coat samples with a single pump down
  • Etch at voltages as low as 100 V for rapid and damage free preparation of sample surfaces 
  • Permit samples as large as 32 mm in diameter
  • Transfer samples from the PECS™ II instrument to a SEM/FIB or glovebox without exposure to air (optional)
  • Store and analyze image in DigitalMicrograph® software from Gatan for digital optical imaging
  • Display and control all PECS II parameters using integrated 10-inch color touch screen

Ilion II System

Ideal for low energy surface preparation for your SEM cross section viewing.

Advantages: 

  • Vacuum load-lock and liquid nitrogen cold stage to provide rapid workflows on beam sensitive samples

  • Real-time observation of the polishing process including an optical microscope with digital imaging; images can be stored and analyzed with DigitalMicrograph® software from Gatan

  • Repeatable results from recipes and operation of the Ilion™ II via a 10" color touch screen interface

  • Damage-free surfaces for analytical techniques, such as cathodoluminescence and EBSD, where the signal is generated near the surface