Scanning Electron Microscopes (FE-SEM)

Electron Microscopes with ultrahigh resolution and outstanding low kV/low vacuum performance for imaging and nano analysis of structures, surface details, and magnetic samples. From the budget-conscious lab to leading edge research center, JEOL offers superior price/performance in the new 7000 series SEMs.

FE-SEM products including:

Conventional FE

  • JSM-7100F
  • JSM-7800F

Semi-in-Lens FE

  • JSM-7500F
  • JSM-7600F