Transmission Electron Microscopes

JEM-1400Plus Electron Microscope

The JEM-1400Plus is a transmission electron microscope (TEM) developed for application in a wide range of disciplines, from biology to materials researches, such as biological sections, polymers, nanomaterials and …. New environment is optimized for ease-of -use TEM operations with followings.

Specifications

Configuration*1

High Contrast (HC)

Resolution (nm)

TEM

Particle image

0.38

Lattice image

0.2

STEM bright-field image
(Edge to edge)

-

Accelerating voltage
Minimum variable 

40、60、80、100、120kV
33V (U*with correction)

Magnification

TEM mode

MAG mode

×200~1,200,000

LOW MAG mode

×10~1,000

SA MAG mode

×2,000~300,000

Specimen tilt angle

Tilt-X

Tilt-Y

Travel range

JEM-2100Plus Electron Microscope

The JEM-2100Plus is a multi purpose transmission electron microscope, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies. 

Specifications

Configuration

Ultrahigh resolution*1
(UHR)

 

 

 

 

Resolution(nm)

 Point

0.194

 

 

 

 

 Lattice

0.14

 

 

 

 

JEM-F200 Multi-purpose Electron Microscope

JEM-F200 is a new field emission transmission electron microscope, which features higher spatial resolution and analytical performance, an easy to use new operation system for multi-purpose operation, a smart appearance, and various environmentally friendly, energy saving system. 

Specifications

Specification

Ultra high resolution 

 

Resolution

 

 

TEM(point resolution)

0.19nm

 

STEM-HAADF mode

0.14 nm (with Cold FEG)
0.16 nm (with Schottky FEG)

 

Accelerating Voltage

200 , 80 kV

Major installable Options

EDS
EELS
Digital Camera
TEM/STEM Tomography System

JEM-ARM200F Atomic Resolution Analytical Electron Microscope

JEM-ARM200F is an Atomic Resolution Analytical Electron Microscope, which boasts an unprecedented STEM-HAADF resolution of 78 pm with a STEM Cs corrector incorporated as standard.

The JEM-ARM200F, with a STEM Cs corrector incorporated as standard, and the mechanical and electrical stability enhanced to the utmost limit, achieves an unprecedented STEM-HAADF resolution of 78 pm*1 and 82 pm *2.  And as the Cs-corrected electron probe has a dramatically increased current density, which is one order larger than conventional FE TEMs, the elemental analysis at the atomic-level becomes possible, along with an extremely enhanced throughput.

*1 : with Cold FEG, *2 : with Schottky FEG

Specifications

Configuration*1

Ultrahigh resolution (UHR)

 

[Resolution]

STEM
Dark Field mode

82 pm (at 200kV, with Schottky FEG)
78 pm (at 200kV, with cold FEG)

 

TEM
(point resolution)

190 pm (at 200kV)
110 pm (at 200kv, with TEM Cs-corrector)


120 pm (at 200kv, with TEM Cs-corrector)

[Magnification]

STEM

x 200 to x 150,000,000

TEM

x 50 to x 2,000,000

[Electron source]

Emitter*2

ZrO/W Schottky
W cold (optional)

 

Accelerating voltage

200 to 80kV(standard 200kV, 80kV)*3,*4

[Specimen System]*5

Stage

Eucentric Side Entry Goniometer stage

Specimen size

3mmφ

Maximum tilt angle*3

X axis: ±25°

Y axis: ±25°

Travel range (mm)

X,Y: ±1, Z:±0.1
(Motor drive/Piezo drive)